Surface-Thin Film Analysis by Ultrasoft X-Ray Fluorescence Spectroscopy
Author:
Affiliation:
1. a Chemistry Department , University of Hawaii , Honolulu , Hawaii , 96822
Publisher
Informa UK Limited
Subject
Spectroscopy,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Link
https://www.tandfonline.com/doi/pdf/10.1080/00387018408068044
Reference7 articles.
1. Liebhafsky , H. A. 1972. “X-Rays, Electrons and Anal. Chem.”, S290–293. N. Y.: Wiley Interscience.
2. Challenges in surface analysis
3. Lee , L. L. 1976. “Characterization of Metal and Polymer Surfaces”, Vol. 1, s1–17. N. Y.: Acad. Press.
4. X-ray photoelectron spectroscopic studies of nickel-oxygen surfaces using oxygen and argon ion-bombardment
5. Resolution of multicomponent fluorescence spectra by an emission wavelength-decay time data matrix
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1. Surface-film and interfacial analysis via variable grazing exit angle x-ray fluorescence spectrometry;Applied Surface Science;1988-01
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