Applications of the image processing method on the structure measurements in porous GaN-Reference-Cited by-同舟云学术

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Applications of the image processing method on the structure measurements in porous GaN

Published:2013-10-10 Issue:1 Volume:9 Page:87-95
ISSN:1745-8080
Container-title:Journal of Experimental Nanoscience
language:en
Short-container-title:Journal of Experimental Nanoscience

Author:

Mahmood Ainorkhilah,Mahmoud Ahmed Naser,Fong Kwong Yam,Lee Siang Chuah,Bukhari Md Yunus Mohd,Hassan Zainuriah

Publisher

Informa UK Limited

Subject

General Materials Science,Biomedical Engineering,Bioengineering

Link

http://www.tandfonline.com/doi/pdf/10.1080/17458080.2013.814173

Reference18 articles.

1. Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers

2. The structural and luminescence properties of porous silicon

3. Detection of Fluorophosphonate Chemical Warfare Agents by Catalytic Hydrolysis with a Porous Silicon Interferometer

4. A Porous Silicon-Based Optical Interferometric Biosensor

5. Correlation between morphology and cathodoluminescence in porous GaP

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1. Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM;IEEE Transactions on Instrumentation and Measurement;2023

2. PVD techniques proffering avenues for fabrication of porous tungsten oxide (WO3) thin films: A review;Materials Science in Semiconductor Processing;2022-06

3. Influence of etching time on the porous p-type gallium nitride using alternating current photo-assisted electrochemical etching technique;International Journal of Nanotechnology;2022

4. Condition assessment and analysis of a reinforced concrete building in India: a case study;Proceedings of the Institution of Civil Engineers - Forensic Engineering;2021-12-01

5. Comparative Studies between Porous Silicon and Porous P-Type Gallium Nitride Prepared Using Alternating Current Photo-Assisted Electrochemical Etching Technique;Journal of Physics: Conference Series;2020-05-01

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