Bootstrap confidence intervals of generalized process capability index Cpyk using different methods of estimation-Reference-Cited by-同舟云学术

Bootstrap confidence intervals of generalized process capability index Cpyk using different methods of estimation

Published:2019-01-31 Issue:10 Volume:46 Page:1843-1869
ISSN:0266-4763
Container-title:Journal of Applied Statistics
language:en
Short-container-title:Journal of Applied Statistics

Author:

Dey Sanku¹,Saha Mahendra²

Affiliation:

1. Department of Statistics, St. Anthony's College, Shillong, Meghalaya, India

2. Department of Statistics, Central University of Rajasthan, Bandarsindri, Rajasthan, India

Publisher

Informa UK Limited

Subject

Statistics, Probability and Uncertainty,Statistics and Probability

Link

https://www.tandfonline.com/doi/pdf/10.1080/02664763.2019.1572721

Reference50 articles.

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3. I.S. Choi and D.S. Bai, Process capability indices for skewed distributions. Proceedings of 20th International Conference on Computer and Industrial Engineering, Kyongju, Korea, 1996, pp. 1211–1214.

4. A NHPP based software reliability model and optimal release policy with logistic–exponential test coverage under imperfect debugging

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