Reliability-guided Rayleigh backscattering spectrum correlation method for distributed strain measurements in optical fibres-Reference-Cited by-同舟云学术

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Reliability-guided Rayleigh backscattering spectrum correlation method for distributed strain measurements in optical fibres

Published:2019-01-17 Issue:5 Volume:66 Page:512-520
ISSN:0950-0340
Container-title:Journal of Modern Optics
language:en
Short-container-title:Journal of Modern Optics

Author:

Suo Liujia¹²,Lei Zhenkun¹,Takezawa Akihiro²,Wu Zhanjun¹

Affiliation:

1. State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology, Dalian, People’s Republic of China

2. Department of Transportation and Environmental Systems, Graduate School of Engineering, Hiroshima University, Hiroshima, Japan

Funder

the National Natural Science Foundation of China

Publisher

Informa UK Limited

Subject

Atomic and Molecular Physics, and Optics

Link

https://www.tandfonline.com/doi/pdf/10.1080/09500340.2018.1549288

Reference11 articles.

1. High-spatial-resolution distributed strain measurement in optical fiber with Rayleigh scatter

2. Long-Range High Spatial Resolution Distributed Temperature and Strain Sensing Based on Optical Frequency-Domain Reflectometry

3. Frequency-derived distributed optical-fiber sensing: Rayleigh backscatter analysis

4. High resolution optical frequency domain reflectometry for characterization of components and assemblies

5. –152.5 dB sensitivity high dynamic-range optical frequency-domain reflectometry

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1. Study of Large Strain OFDR Sensor Based on Inclined Transfer Structure;Journal of Circuits, Systems and Computers;2024-08-08

2. Strain Measurement Range Extension of OFDR Based on Self-Correcting 2-D Cross Correlation;IEEE Sensors Journal;2024-07-15

3. Research on the OFDR strain measurement method based on similarity features of dual-segment RSS;Optics Express;2024-07-09

4. 高性能光频域分布式光纤测试与传感技术研究进展;Acta Optica Sinica;2024

5. Location deviation correction method based on cross-correlation spectrum in OFDR;Applied Optics;2023-10-06

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