Measurement of planar refractive index profiles with rapid variations in glass using interferometry and total variation regularized differentiation
Author:
Publisher
Informa UK Limited
Subject
Atomic and Molecular Physics, and Optics
Link
http://www.tandfonline.com/doi/pdf/10.1080/09500340.2015.1083130
Reference23 articles.
1. Determination of refractive index profiles of gradient optical waveguides by ellipsometry
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3. Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements
4. Construction of refractive-index profiles of planar dielectric waveguides from the distribution of effective indexes
5. Field-induced index profiles of multimode ion-exchanged strip waveguides
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