1. Corbett, J. W., Bourgoin, J. C., Cheng, L. J., Corelli, J. C., Lee, Y. H., Mooney, P. M. and Weigel, C. 1976.Radiation Effects in Semiconductors, Edited by: Urli, N. B. and Corbett, J. W. 1Bristol: The Institute of Physics. 1977
2. Characterization of impurities and defects by electron paramagnetic resonance and related techniques
3. Classification of Defects in Silicon after Theirg−;Values
4. Corbett, J. W., Corelli, J. C., Desnica, U. and Snyder, L. C. 1985.Microscopic Identification of Electronic Defects in Semiconductors, Edited by: Johnson, N. M., Bishop, S. G. and Watkins, G. D. 243ffPittsburg: Materials Research Society.
5. Ammerlaan, C. A. J., Sprenger, M., van Kemp, R. and van Wezep, D. A. 227ff in Ref. 4