1. Abe, T., Kikuki, K., Shirai, S. and Muraoka, S. 1981.Semiconductor Silicon, Edited by: Huff, R., Kriegler, J. and Takeishi, Y. Vol. 81.5, 155Pennington, NJ: Electrochemical Society.
2. Oehrlein, G. S. and Corbett, J. W. 1983.Defects in Semiconductors, Edited by: Maharajan, S. and Corbett, J. W. Vol. II, 107New York: North-Holland.
3. Effect of oxide precipitates on minority‐carrier lifetime in Czochralski‐grown silicon
4. Newman, R. C. 1986.Oxygen, Carbon, Hydrogen and Nitrogen in Crystalline Silicon, Edited by: Mikkelsen, J. C. Jr., Pearton, S. J., Corbett, J. W. and Pennycook, S. J. Vol. 59, 403Pittsburg, Penn.: MRS.