Lithium implantation profiles in metals and semiconductors-Reference-Cited by-同舟云学术

Lithium implantation profiles in metals and semiconductors

Published:1989-05 Issue:1 Volume:108 Page:27-44
ISSN:1042-0150
Container-title:Radiation Effects and Defects in Solids
language:en
Short-container-title:Radiation Effects and Defects in Solids

Author:

Fink D.,Kie Tjan,Biersack J. P.,Lihong Wang,Yunru Ma

Publisher

Informa UK Limited

Subject

Condensed Matter Physics,General Materials Science,Nuclear and High Energy Physics,Radiation

Link

http://www.tandfonline.com/doi/pdf/10.1080/10420158908217867

Reference23 articles.

1. Fink, D. 1974. Berlin: Free University. Thesis, Bibl.Nr. HO3, 0833

2. Fink, d., Biersack, J. P. and Liebl, H. 1983.Ion Implantation: Equipment and Techniques, Edited by: Ryssel, H. and Glawischnig, H. p. 318Berlin/Heidelberg: Springer-Verlag.

3. Background reduction in light element depth profiling by a coincidence technique

4. Müller, K. 1979. Technical University Munich. Thesis

5. The use of neutron induced reactions for light element profiling and lattice localization

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