Numerical studies on sub-10 nanometer resolution imaging in electrostatic force microscopy-Reference-Cited by-同舟云学术

Numerical studies on sub-10 nanometer resolution imaging in electrostatic force microscopy

Published:2017-07-24 Issue:1 Volume:182 Page:148-160
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Xu Honglei¹,Zhao Liangbing¹,Ding Xidong¹²,Lin Guocong¹,Chen Dihu¹²

Affiliation:

1. State Key Laboratory of Optoelectronic Materials and Technologies, and School of Physics, Sun Yat-sen University, Guangzhou, People's Republic of China

2. SYSU-CMU Shunde International Joint Research Institute, Shunde, Guangdong, People's Republic of China

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584587.2017.1352411

Reference26 articles.

1. Deposition and imaging of localized charge on insulator surfaces using a force microscope

2. Kelvin probe force microscopy

3. Kelvin probe force microscopy of C60 on metal substrates: towards molecular resolution

4. Atomic contact potential variations of Si(111)-7 × 7 analyzed by Kelvin probe force microscopy

5. Atomic Scale Kelvin Probe Force Microscopy Studies of the Surface Potential Variations on theTiO2(110)Surface

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