Identification of the Occupation Site of Dy- or Y-Substituted PZT Films and the Correlation Between Occupation Site and Ferroelectric Property

Author:

Nishida Ken1,Osada Minoru2,Uchida Hiroshi3,Nakaki Hiroshi4,Funakubo Hiroshi4,Shima Hiromi1,Nishide Masamichi1,Tai Takeshi1,Woonhg Kim Jin1,Matsuoka Masashi1,Katoda Takashi5,Yamamoto Takashi1

Affiliation:

1. a Department of Communications Engineering , National Defense Academy , Yokosuka , Kanagawa , 239-8686 , Japan

2. b International Center for Materials Nanoarchitectonics , National Institute for Materials Science , Tsukuba , Ibaraki , 305-0044 , Japan

3. c Department of Chemistry , Sophia University , 7-1 Kioi-cho, Chiyoda-ku , Tokyo , 102-8554 , Japan

4. d Department of Innovative and Engineered Materials , Tokyo Institute of Technology , J2-43, 4259 Nagatsuta-cho, Midori-ku, Yokohama , Kanagawa , 226-8502 , Japan

5. e Department of Electronic and Photonic Systems Engineering , Kochi University of Technology, 185 Miyanokuchi Tosayamada-cho , Kochi , 782-8502 , Japan

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

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