Characterization in a Wide Frequency Range (40 MHz–67 GHz) of a KTa0.65Nb0.35O3 Thin Film for Tunable Applications-Reference-Cited by-同舟云学术

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Characterization in a Wide Frequency Range (40 MHz–67 GHz) of a KTa0.65Nb0.35O3 Thin Film for Tunable Applications

Published:2014-11-22 Issue:1 Volume:158 Page:52-61
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Houzet Grégory¹,Lacrevaz Thierry¹,Bermond Cédric¹,Fléchet Bernard¹,Le Febvrier Arnaud²,Députier Stéphanie²,Guilloux-Viry Maryline²,Queffelec Patrick³

Affiliation:

1. IMEP-LAHC, UMR CNRS 5130, Université de Savoie, 73376 Le Bourget du Lac cedex, France

2. ISCR, UMR CNRS 6226, Université de Rennes 1, 35042 Rennes cedex, France

3. Lab-STICC, UMR CNRS 6285, Université de Bretagne Occidentale, 29238 Brest cedex 3, France

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584587.2014.957091

Reference33 articles.

1. Structure and Device Characteristics of SrBi2Ta2O9-Based Nonvolatile Random-Access Memories

2. Ferroelectric thin films: Review of materials, properties, and applications

3. Silicon lithium niobate electro-optic waveguide modulator structures in the parallel-plate configuration

4. Thin-film ferroelectric microwave devices

5. CHARACTERIZATION OF FERROELECTRIC FILMS UP TO 60 Ghz: APPLICATION TO PHASE SHIFTERS

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