Atomic Force Microscope Techniques for Adhesion Measurements
Author:
Publisher
Informa UK Limited
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,General Chemistry
Link
http://www.tandfonline.com/doi/pdf/10.1080/00218460008034535
Reference31 articles.
1. Atomic Force Microscope
2. Electrostatic and contact forces in force microscopy
3. High-resolution force microscopy of in-plane magnetization
4. Direct measurement of colloidal forces using an atomic force microscope
5. Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substrate
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