Corrections of Interference Thickness Measurements of Thin Films on Account of Boundary Reflections-Reference-Cited by-同舟云学术

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Corrections of Interference Thickness Measurements of Thin Films on Account of Boundary Reflections

Published:1957-06 Issue:2 Volume:4 Page:59-68
ISSN:0030-3909
Container-title:Optica Acta: International Journal of Optics
language:en
Short-container-title:Optica Acta: International Journal of Optics

Author:

Lindberg Per J.¹

Affiliation:

1. a Royal Institute of Technology, Stockholm

Publisher

Informa UK Limited

Subject

Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/713826072

Reference13 articles.

1. Use of Multilayer Films for Surface Topography Interferometry

2. On a method of increasing contrast in microscopy

3. Determination by interferometric methods of the thickness of the reference system used in microradiography

4. NOMARSKI , G. Contraste de Phase e Contrasle par Intérfrences 65 EonRev. d'Opt. Paris, 1952

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Interferometric thickness measurements on transparent thin films;Journal of Physics D: Applied Physics;1971-06-01

2. Die optischen Konstanten der Halbleiter;Festkörperprobleme 2

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