Multi-Resolution and Noise-Resistant Surface Defect Detection Approach Using New Version of Local Binary Patterns-Reference-Cited by-同舟云学术

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Multi-Resolution and Noise-Resistant Surface Defect Detection Approach Using New Version of Local Binary Patterns

Published:2017-07-03 Issue:5-6 Volume:31 Page:395-410
ISSN:0883-9514
Container-title:Applied Artificial Intelligence
language:en
Short-container-title:Applied Artificial Intelligence

Author:

Fekri-Ershad Shervan¹²,Tajeripour Farshad³

Affiliation:

1. Faculty of Computer Engineering, Najafabad Branch, Islamic Azad University, Najafabad, Iran

2. Big Data Research Center, Najafabad Branch, Islamic Azad University, Najafabad, Iran

3. Department of Computer Science and Engineering, Shiraz University, Shiraz, Iran

Publisher

Informa UK Limited

Subject

Artificial Intelligence

Link

https://www.tandfonline.com/doi/pdf/10.1080/08839514.2017.1378012

Reference20 articles.

1. Suitability Analysis of Techniques for Flaw Detection in Textiles using Texture Analysis

2. Fabric defect detection by Fourier analysis

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