1. Consequences of spatial distributions of the interface states on the Schottky barrier
2. Kern, W. 1993.Handbook of Semiconductor Wafer Cleaning, Edited by: Kern, W. 3Park Ridge, N. J.: Noyes Publications. and p. 595.
3. Burkman, D. C., Deal, D., Grant, D. C. and Peterson, C. A. 1993.Handbook of Semiconductor Wafer Cleaning, Edited by: Kern, W. 111Park Ridge, N.J.: Noyes Publications.
4. Ruzyllo, J. 1993.Handbook of Semiconductor Wafer Cleaning, Edited by: Kern, W. 201Park Ridge, N. J.: Noyes Publications.
5. Laser‐assisted micron scale particle removal