1. Certain trade names and company products are identified in order to specify adequately the experimental procedure. In no case does such identification imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the products are necessarily the best for the purpose
2. Epoxide Equivalent Weight Determination by Carbon-13 Nuclear Magnetic Resonance
3. X-ray and neutron reflectivity for the investigation of polymers
4. A unique profile cannot be obtained from the reflectivity data, but rather there is a range of parameter values which are consistent with the data. The range for the thickness of the D2O-rich layer is 5–25 Å. The SLD for the D2O-rich layer can range from 3.2 to 6.0, with the higher SLD corresponding to the smaller thickness. The upper end of this range corresponds to a layer of nearly pure D2O. The profile plotted in Figures 1b and c falls in the middle of the range of acceptable values for the thickness of the D2O-rich layer