Electron microscope image profiles of planar defects in crystals
Author:
Affiliation:
1. a Cavendish Laboratory , University of Cambridge
2. b Department of Metallurgy , University of Oxford
Publisher
Informa UK Limited
Link
https://www.tandfonline.com/doi/pdf/10.1080/14786436708220899
Reference7 articles.
1. A relation between dark field electron micrographs of lattice defects
2. Thesis;Booker G. R.,1966
3. Diffraction contrast effects from stacking faults with phase angle π
4. Anomalous electron absorption effects in metal foils: theory and comparison with experiment
5. Diffraction contrast of electron microscope images of crystal lattice defects - II. The development of a dynamical theory
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