Author:
Germer L. H.,Scheibner E. J.,Hartman C. D.
Cited by
74 articles.
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1. Low-Energy Electron Diffraction;Advances in Chemical Physics;2007-03-14
2. FIELD EMISSION: A TOOL FOR STUDYING SEMICONDUCTOR SURFACES;Annals of the New York Academy of Sciences;2006-12-22
3. PROPERTIES OF SEMICONDUCTOR SURFACES;Annals of the New York Academy of Sciences;2006-12-22
4. Local structure determination for low-coverage CO on Ni(111);Journal of Physics: Condensed Matter;1996-03-04
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