Surface damage on abraded silicon specimens
Author:
Publisher
Informa UK Limited
Link
http://www.tandfonline.com/doi/pdf/10.1080/14786436308213842
Reference22 articles.
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2. The depth of surface damage produced by lapping germanium monocrystals
3. Method of preparing Si and Ge specimens for examination by transmission electron microscopy
4. Dislocations in mechanically deformed Ge
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