Systematic errors in dislocation densities measured by thin film electron microscopy
Author:
Affiliation:
1. a Department of Physics , Battersea College of Technology , London , S.W. 11
Publisher
Informa UK Limited
Link
https://www.tandfonline.com/doi/pdf/10.1080/14786436608219000
Reference10 articles.
1. Stored energy and electrical resistivity in deformed metals
2. Stored energy and flow stress in deformed metals
3. Cottrell , A. H. 1953. Dislocations and Plastic Flow in Crystals, 38Oxford: Clarendon Press.
4. Nuclear magnetic resonance, stored energy, and the density of dislocations in deformed aluminium
5. On the loss of dislocations during the preparation of a thin film
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The interaction of conduction electrons with dislocations and grain boundaries in metals;Canadian Journal of Physics;1982-05-01
2. The dislocation cell size and dislocation density in copper deformed at temperatures between 25 and 700°C;Acta Metallurgica;1972-04
3. On dislocation loss in thin film electron microscopy of polycrystalline copper;The Philosophical Magazine: A Journal of Theoretical Experimental and Applied Physics;1968-04
4. An experimental investigation of dislocation-phonon scattering in some copper alloys;Physica Status Solidi (b);1968
5. An experimental determination of the electrical resistivity of dislocations in copper;The Philosophical Magazine: A Journal of Theoretical Experimental and Applied Physics;1967-12
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