Author:
Bicknell R. W.,Charig J. M.,Joyce B. A.,Stirland D. J.
Reference15 articles.
1. Bassett, G. A. Proc. European Conf. Electron Microscopy. Delft. pp.270Delft: D. Nederlandse verenigining voor electronenmicroscopie.
2. Bassett, G. A., Menter, J. W. and Pashley, D. W. Proc. Int. Conf. Struct. and Props. of Thin Films. Bolton Landing, N.Y. pp.11New York: J. Wiley and Sons.
3. Crystallographic Imperfections in Epitaxially Grown Silicon
4. Study of background structure in platinum/carbon shadowing deposits
5. Epitaxial Growth of Silicon by Hydrogen Reduction of SiHCl[sub 3] onto Silicon Substrates
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