Observation of latent heavy-ion tracks in GeS by transmission electron microscopy

Author:

Scholz R.1,Vetter J.2,Hopfe S.1

Affiliation:

1. a MPI für Mikrostrukturphysik , Weinberg 2, D-O-4050, Halle (Saale), Germany

2. b GSI , Postfach 110552, D-W-6100, Darmstadt, Germany

Publisher

Informa UK Limited

Subject

Condensed Matter Physics,General Materials Science,Nuclear and High Energy Physics,Radiation

Cited by 20 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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2. Electronic excitations and heavy-ion-induced processes in ionic crystals;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-08

3. Radiation Damage in Crystals;digital Encyclopedia of Applied Physics;2003-04-15

4. Investigation of heavy ion tracks in polymers by transmission electron microscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-12

5. 12C5+ radiation effects in SR-86 track recording polymer;Bulletin of Materials Science;1999-06

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