Mild degradation processes in ZnO-based varistors: the role of Zn vacancies-Reference-Cited by-同舟云学术

Mild degradation processes in ZnO-based varistors: the role of Zn vacancies

Published:2015-02-09 Issue:7 Volume:95 Page:730-743
ISSN:1478-6435
Container-title:Philosophical Magazine
language:en
Short-container-title:Philosophical Magazine

Author:

Ponce M.A.,Macchi C.,Schipani F.,Aldao C.M.,Somoza A.

Funder

Agencia Nacional de Promoción Científica y Tecnológica

Consejo Nacional de Investigaciones Científicas y Técnicas

Publisher

Informa UK Limited

Subject

Condensed Matter Physics

Link

http://www.tandfonline.com/doi/pdf/10.1080/14786435.2015.1006291

Reference46 articles.

1. M. Seitz, F. Hampton and W. Richmond,Additives and interfaces in electronic ceramics, inAdvanced in Ceramics, Vol. 7, M.F. Yan and A.H. Heuer, eds. The American Ceramic Society Inc., Columbus, 1983, p.60.

2. Varistor Ceramics

3. High-field ZnO-based varistors

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