Determination of Optical Constants of Thin Films with Non-uniform Thickness from the Fringe Pattern of the Transmittance Spectra
Author:
Affiliation:
1. a Institute of Experimental Physics, SZAB Szekhaz, Szeged, Somogyi B U7, H-6720 Hungary
Publisher
Informa UK Limited
Subject
Electronic, Optical and Magnetic Materials
Link
https://www.tandfonline.com/doi/pdf/10.1080/713821745
Reference10 articles.
1. Determination of optical constants and thickness of anisotropic crystal plates from transmission measurements
2. A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film
3. Determination of the optical constants and thickness of amorphous V2O5 thin films
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