Binning methodology for nonparametric goodness-of-fit test

Author:

Zhang Chunming,Cheng Bin

Publisher

Informa UK Limited

Subject

Applied Mathematics,Statistics, Probability and Uncertainty,Modeling and Simulation,Statistics and Probability

Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Dynamic Defect Detection in Fast, Robust NDE Methods by Transfer Learning Based Optimally Binned Hypothesis Tests;Research in Nondestructive Evaluation;2024-02-28

2. Tests of goodness of fit based on Phi-divergence;Journal of Applied Statistics;2015-07-31

3. Inference on varying-coefficient partially linear regression model;Acta Mathematicae Applicatae Sinica, English Series;2015-01

4. Random Weighting Empirical Distribution Function and its Applications to Goodness-of-Fit Testing;Communications in Statistics - Simulation and Computation;2014-10-24

5. General treatment of goodness-of-fit tests based on Kullback–Leibler information;Journal of Statistical Computation and Simulation;2013-08

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