Polarimetric Bistatic-Scattering Measurement System Out of Plane of Incidence-Reference-Cited by-同舟云学术

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Polarimetric Bistatic-Scattering Measurement System Out of Plane of Incidence

Published:2002-02 Issue:2 Volume:22 Page:113-122
ISSN:0272-6343
Container-title:Electromagnetics
language:en
Short-container-title:Electromagnetics

Author:

Hsieh Chin-Yuan

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering,Radiation,Electronic, Optical and Magnetic Materials

Link

http://www.tandfonline.com/doi/pdf/10.1080/027263402753455456

Reference9 articles.

1. Fung, A. K. (1994). Microwave scattering and emission models and their applications. Artech House.

2. A scattering model for perfectly conducting random surfaces I. Model development

3. Hauck, B., F. T. Ulaby, & R. DeRoo. (1998). Polarimetric bistatic-measurement facility for point and distributed targets. IEEE Transaction on Antennas and Propagation AP-40(1):31-41.

4. Scattering from very rough metallic and dielectric surfaces: a theory based on the modified Kirchhoff approximation

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1. An Efficient Electromagnetics Measurement of 3D Bistatic Scattering Problem at Oblique Incident;2019 International Applied Computational Electromagnetics Society Symposium - China (ACES);2019-08

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