Evolution of millimetric-range electrostatic forces between an AFM cantilever and a charged dielectric via suspended force curves-Reference-Cited by-同舟云学术

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Evolution of millimetric-range electrostatic forces between an AFM cantilever and a charged dielectric via suspended force curves

Published:2021-08-27 Issue: Volume: Page:1-18
ISSN:0021-8464
Container-title:The Journal of Adhesion
language:en
Short-container-title:The Journal of Adhesion

Author:

Lai Tianmao¹,Guo Mingli¹,Chen Yuguo¹

Affiliation:

1. School of Mechanical and Electric Engineering, Guangzhou University, Guangzhou, China

Funder

National Natural Science Foundation of China

Guangdong Basic and Applied Basic Research Foundation

Science and Technology Program of Guangzhou, China

Publisher

Informa UK Limited

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,General Chemistry

Link

https://www.tandfonline.com/doi/pdf/10.1080/00218464.2021.1969922

Reference44 articles.

1. Atomic Force Microscope

2. Deposition and imaging of localized charge on insulator surfaces using a force microscope

3. Contact electrification using force microscopy

4. High resolution atomic force microscopy potentiometry

5. High‐resolution capacitance measurement and potentiometry by force microscopy

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1. Evolution of adhesion force behavior at the silica-HOPG interface from humidity-independent to humidity-dependent revealed on an AFM;The Journal of Adhesion;2023-02-28

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