Measurements of the nonlinear refractive index of free-standing porous silicon layers at different wavelengths-Reference-Cited by-同舟云学术

Measurements of the nonlinear refractive index of free-standing porous silicon layers at different wavelengths

Published:2001-02 Issue:2 Volume:81 Page:133-139
ISSN:1364-2812
Container-title:Philosophical Magazine B
language:en
Short-container-title:Philosophical Magazine B

Author:

Lettieri S.¹,Maddalenat P.¹,Odierna L. P.¹,Ninno D.¹,La Ferrara V.²,Di Francia G.²

Affiliation:

1. a Istituto Nazionale per la Fisica della Materia, Dipartiinento di Scienze Fisiche , Università di Napoli ‘Federico II’, Complesso Universitario di M.te S. Angelo , Via Cintia, I-80126 , Napoli , Italy

2. b Centro Ricerche Fotovoltaiche , Ente Nazionale Energìa Alterniva, Localià Granatello, I-80055 , Portici (Napoli) , Italy

Publisher

Informa UK Limited

Subject

General Physics and Astronomy,General Chemical Engineering

Link

https://www.tandfonline.com/doi/pdf/10.1080/13642810012470

Reference25 articles.

1. Evidence of Nanostructures of Different Size in Porous Silicon

2. Two-photon absorption in semiconductor nanocrystals

3. Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers

4. Below-band-gap third-order optical nonlinearity of nanometer-size semiconductor crystallites

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