Imaging point defects using a transmission electron microscope with controllable spherical aberration
Author:
Affiliation:
1. a Department of Applied Physics , University of Technology , Sydney PO Box 123, Broadway , New South Wales , 2007 , Australia
Publisher
Informa UK Limited
Subject
General Physics and Astronomy,General Chemical Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/13642810108223112
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1. An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging
2. The influence of atomic vibrations on the imaging properties of atomic focusers
3. L'agglomeration des defauts ponctuels dans les metaux irradies decrite par les equations de la cinetique chimique
4. Irradiation damage in nickel and iron in a high-voltage electron microscope and threshold energy determination
5. Study of Agglomerated Defects in Irradiated Pure Nickel by Electron Microscopy
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