Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns?

Author:

Van Aert S.1,Vandyck D.2

Affiliation:

1. a Department of Applied Physics , Delft University of Technlogy , Lorentzweg 1, 2628 CJ Delft , The Netherlands

2. b Department of Physics , University of Antwerp , Groenenborgerlaan 171, 2020 Antwerp , Belgium

Publisher

Informa UK Limited

Subject

General Physics and Astronomy,General Chemical Engineering

Reference17 articles.

1. Model-based two-object resolution from observations having counting statistics

2. A useful approximation of the exit wave function in coherent STEM

3. Cowley , J. M. 1997. Handbook of Microscopy–Applications in Materials Science, Solid-State Physics and Chemistry, Edited by: Amelinckx , S. Van Dyck , D. Van Landuyt , J. and Van Tendeloo , G. Vol. 2, pp. 563–594. Weinheim: VCH. chapter 4

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