Evaluation of mineral liberation and stereological bias based on X-ray microtomography and scanning electron microscopy for an iron ore tailing-Reference-Cited by-同舟云学术

Evaluation of mineral liberation and stereological bias based on X-ray microtomography and scanning electron microscopy for an iron ore tailing

Published:2021-08-10 Issue:3 Volume:131 Page:250-259
ISSN:2572-6641
Container-title:Mineral Processing and Extractive Metallurgy
language:en
Short-container-title:Mineral Processing and Extractive Metallurgy

Author:

Ramos Oliveira Guilherme José¹²,Horta Daniela Gomes²,da Silva Fabiane Leocádia³,von Krüger Fernando Leopoldo⁴,Silva Guilherme Jorge Brigolini⁵,Mazzinghy Douglas Batista¹

Affiliation:

1. Department of Mining Engineering, Federal University of Minas Gerais, PPGEM, Belo Horizonte, Brazil

2. Department of Mining Engineering, Federal University of Alfenas, Poços de Caldas, Brazil

3. Department of Exact Sciences, State University of Minas Gerais, João Monlevade, Brazil

4. Department of Metallurgical and Materials Engineering, Federal University of Ouro Preto, REDEMAT, Ouro Preto, Brazil

5. Department of Civil Engineering, Federal University of Ouro Preto, PROPEC, Ouro Preto, Brazil

Funder

CNPq

Publisher

Informa UK Limited

Subject

Geochemistry and Petrology,Geotechnical Engineering and Engineering Geology,General Chemistry

Link

https://www.tandfonline.com/doi/pdf/10.1080/25726641.2021.1965775

Reference26 articles.

1. An introduction to the application of X-ray microtomography to the three-dimensional study of igneous rocks

2. Berger MJ, Hubbell JH, Seltzer SM, Chang J, Coursey JS, Sukumar R, Zucker DS, Olsen K. 2010. XCOM: photon cross sections database. NIST Standard ReferenceDatabase 8 (XGAM).

3. High-resolution X-ray computed tomography in geosciences: A review of the current technology and applications

4. Two stereological correction methods: Allocation method and kernel transformation method

5. Description of Ore Particles from X-Ray Microtomography (XMT) Images, Supported by Scanning Electron Microscope (SEM)-Based Image Analysis

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