Optical Properties of Organic Films for Compact Disk

Author:

Röseler A.1,Korte E.1,Poperenko L. V.12,Kravets V. G.13,Vinnichenko E. L.13

Affiliation:

1. a Institut für Spektrochemie und Angewandte Spektroskopie, Institutsteil Berlin , Adlershof , Germany

2. b Department of Physics , Kyiv Taras Shevchenko Univ. , Kyiv , Ukraine

3. c Inst. For Information Recording Problems , Kyiv , Ukraine

Publisher

Informa UK Limited

Subject

Condensed Matter Physics

Reference5 articles.

1. Röseler , A. 1990. Infrared Spectroscopic Ellipsometry, 160Berlin: Akademie-Verlag.

2. Röseler , A. and Korte , E. H. 1997. Abstracts of 2nd Int. Conf On Spectroscopic Ellpsometry. 1997, Charleston, USA. pp.616

3. Fundamentals of ellipsometry. 1979. Edited by: Rzhanov , A. V. 422Novosibirsk: Nauka. (in Russian)

4. Petrov , V. V. Kruchin , A. A. Tokar , A. P. 1992. Optical mechanical memory devices, 152Kiev: Naukova Dumka. (in Russian)

5. Hole formation in tellurium alloy films during optical recording

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. ELLIPSOMETRIC CHARACTERIZATION OF THIN FILMS;Handbook of Surfaces and Interfaces of Materials;2001

2. Characterization and optical properties of organic dye films as recording media;Semiconductor Physics, Quantum Electronics and Optoelectronics;2000-12-12

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