Rapid Parallel Search Technology with Scanning Electron Microscope and Artificial Neural Network-Reference-Cited by-同舟云学术

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Rapid Parallel Search Technology with Scanning Electron Microscope and Artificial Neural Network

Published:2022-06-22 Issue: Volume: Page:1-7
ISSN:2308-0477
Container-title:Smart Science
language:en
Short-container-title:Smart Science

Author:

Shulunov Vyacheslav R¹^ORCID

Affiliation:

1. Institute of Physical Materials Science, Siberian Branch of the Russian Academy of Sciences, Ulan-Ude, Russia

Publisher

Informa UK Limited

Subject

Computational Mathematics,Computer Networks and Communications,Fluid Flow and Transfer Processes,General Engineering,Energy (miscellaneous),Modeling and Simulation,Chemistry (miscellaneous)

Link

https://www.tandfonline.com/doi/pdf/10.1080/23080477.2022.2092671

Reference35 articles.

1. Rapid coronavirus tests: a guide for the perplexed

2. Will antibody tests for the coronavirus really change everything?

3. The Strengths of Scanning Electron Microscopy in Deciphering SARS-CoV-2 Infectious Cycle

4. CDC. Negative staining electron microscopic protocol for rash illness. 2006. Available from: http://www.bt.cdc.gov/agent/smallpox/lab-testing/pdf/em-rash-protocol.pdf. Cited June 18, 2022.

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