A Proposal to Classify Methods Employed to Detect Thin Phase Structures Under Coherent Illumination-Reference-Cited by-同舟云学术

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A Proposal to Classify Methods Employed to Detect Thin Phase Structures Under Coherent Illumination

Published:1980-07 Issue:7 Volume:27 Page:917-929
ISSN:0030-3909
Container-title:Optica Acta: International Journal of Optics
language:en
Short-container-title:Optica Acta: International Journal of Optics

Author:

Ojeda-Castañeda J.¹

Affiliation:

1. a Instituto Nacional de Astrofísica, Optica y Electrónica, Apdo. Postal 216, Puebla, Pue., Mexico

Publisher

Informa UK Limited

Subject

Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/713820329

Reference18 articles.

1. BORN , M. and WOLF , E. 1970. Principles of Optics, 242Oxford: Pergarnon Press.

2. KRCG , W. RIENITZ , J. and SCHULTZ , G. 1964. Contributions to Interference Microscopy, 22London: Hilger & Watts.

3. MENZEL , E. 1960. Optics in Metrology, Edited by: Mollet , P. 283New York: Pergamon Press.

4. Necessary and Sufficient Conditions for Thin Phase Imagery

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1. Schlieren masks: square root monomials, sigmoidal functions, and off-axis Gaussians;Applied Optics;2020-04-16

2. Novel free-form optical pairs for tunable focalizers;Journal of Optics;2014-05-14

3. Imaging phase objects with square-root, Foucault, and Hoffman real filters: a comparison;Applied Optics;2003-10-10

4. Isotropic Hilbert transform by anisotropic spatial filtering;Applied Optics;1986-11-15

5. Necessary and Sufficient Conditions for Thin Phase Imagery;Optica Acta: International Journal of Optics;1980-07

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