TheX-ray topographic image contrast of ferroelectric domain boundaries in triglycine sulphate crystals

Author:

Parpia D. Y.1

Affiliation:

1. a University of Saarland , F.B. 12.1, D-6600 , Saarbrücken , F.R. Germany

Publisher

Informa UK Limited

Subject

Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Contrast of Dislocation Images in X-Ray Transmission Topography

2. Contrast of a Stacking Fault on X-Ray Topographs

3. Amelinckx , S. Gevers , R. Remaut , G. and van Landuyt , J. , eds. 1969. Modern Diffraction and Imaging Techniques in Materials Science, 481Amsterdam: North Holland.

4. Queisser , H.J. , ed. 1977. Topics in Applied Physics, Vol. 22, 145New York: Springer-Verlag.

5. X-ray topographic determination of the intrinsic or extrinsic nature of stacking faults

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