Author:
Boothroyd C. B.,Crawley A. P.,Stobbs W. M.
Subject
Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. Institute of Physics Conference Series, No. 78;Alexander K. B.,1985
2. Cockayne, D. J. H. 1982.Electron Microscopy, Vol. 2, 79–86. Frankfurt: Deutsche Gesellschafte für Elektronemikroskopie.
3. A first report on a systematic study of tilt-boundaries in hard-sphere f.c.c. crystals
4. Institute of Physics Conference Series, No. 78;Ness J. N.,1985
5. A TEM fresnel diffraction-based method for characterizing thin grain-boundary and interfacial films
Cited by
19 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献