Author:
Wittmer M.,Huang H. C. W.,Legoues F.
Subject
Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials
Reference32 articles.
1. Reduction of Electromigration in Aluminum Films by Copper Doping
2. Baglin, J. E. E. and Poate, J. M. 1978.Thin Films-Interdiffusion and Reactions, Edited by: Poate, J. M., Tu, K. N. and Mayer, J. W. 305Princeton: The Electrochemical Society, Inc.
3. An X-ray analysis of the nickel-aluminium system
4. Hillock growth in thin films
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