The use of convergent-beam electron diffraction to determine local lattice distortions in nickel-base superalloys-Reference-Cited by-同舟云学术

The use of convergent-beam electron diffraction to determine local lattice distortions in nickel-base superalloys

Published:1986-07 Issue:1 Volume:54 Page:79-92
ISSN:0141-8610
Container-title:Philosophical Magazine A
language:en
Short-container-title:Philosophical Magazine A

Author:

Kaufman M. J.¹²,Pearson D. D.¹³,Fraser H. L.¹

Affiliation:

1. a Department of Metallurgy and the Materials Research Laboratory , University of Illinois , 1304 W. Green Street, Urbana , Illinois , 61801 , U.S.A.

2. b Metallurgy Division , National Bureau of Standards , Gaithersburg , Maryland , 20899 , USA

3. c United Technologies Research Center , Silver Lane, East Hartford , Connecticut , 06108 , U.S.A.

Publisher

Informa UK Limited

Subject

Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/01418618608242884

Reference11 articles.

1. Diffraction contrast from spherically symmetrical coherency strains

2. Elastic Constants of Single‐Crystal Ni3Al from 10° to 850°C

3. The measurement of precipitate/matrix lattice mismatch in nickel-base superalloys

4. Grain-boundary migration in single-phase and particle-containing materials

5. The Elastic Constants of Crystals

Cited by 33 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond;Microscopy and Microanalysis;2019-05-14

2. Strain Measurements and Mapping;Advanced Transmission Electron Microscopy;2016-10-27

3. Atom site preference and γ′/γ mismatch strain in Ni Al Co Ti superalloys;Intermetallics;2016-06

4. Large area strain analysis using scanning transmission electron microscopy across multiple images;Applied Physics Letters;2015-01-05

5. Transmission Electron Microscopy for Physical Metallurgists;Physical Metallurgy;2014