Use of Ion Scattering and Secondary Ion Mass Spectrometry to Characterize Apparent “Adhesive” Failure in an Adhesive Bond
Author:
Affiliation:
1. a Mechanics and Surface Interactions Branch , Air Force Materials Laboratory , Wright-Patterson AFB, Ohio , 45433 , U.S.A.
Publisher
Informa UK Limited
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,General Chemistry
Link
https://www.tandfonline.com/doi/pdf/10.1080/00218467608075057
Reference8 articles.
1. Bikerman , J. 1973. Recent Advances in Adhesion, Edited by: Lee , Lieng-Huang . 351–356. New York: Gordon and Breach Science Publishers.
2. Good , R. J. 1973. Recent Advances in Adhesion, Edited by: Lee , Lieng-Huang . 357–377. New York: Gordon and Breach Science Publishers.
3. The detection of thin films of epoxy resin on metal surfaces
4. Ion Scattering Spectrometry
5. Beobachtung von oberflächenreaktionen mit der statischen methode der sekundärionen-massenspektroskopie. I die methode
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