Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction-Reference-Cited by-同舟云学术

Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction

Published:2021-01-11 Issue:4 Volume:9 Page:182-188
ISSN:2166-3831
Container-title:Materials Research Letters
language:en
Short-container-title:Materials Research Letters

Author:

Zhou Guangni¹²,Pantleon Wolfgang²^ORCID,Xu Ruqing³,Liu Wenjun³,Chen Kai¹^ORCID,Zhang Yubin²^ORCID

Affiliation:

1. Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an, People’s Republic of China

2. Department of Mechanical Engineering, Technical University of Denmark, Kongens Lyngby, Denmark

3. Advanced Photon Source, Argonne National Laboratory, Lemont, IL, USA

Funder

Basic Energy Sciences

China Scholarship Council

National Natural Science Foundation of China

National Key Research and Development Program of China

Publisher

Informa UK Limited

Subject

General Materials Science

Link

https://www.tandfonline.com/doi/pdf/10.1080/21663831.2020.1862932

Reference28 articles.

1. Dislocations and the Mechanical Properties of Crystals

2. 50 Years of TEM of dislocations: Past, present and future

3. The effect of dislocation contrast on x‐ray line broadening: A new approach to line profile analysis

4. Quantitative analysis of strain field in thin films from HRTEM micrographs

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