Impact of epitaxial strain on crystal field splitting of α-Cr2O3(0001) thin films quantified by X-ray photoemission spectroscopy-Reference-Cited by-同舟云学术

Impact of epitaxial strain on crystal field splitting of α-Cr2O3(0001) thin films quantified by X-ray photoemission spectroscopy

Published:2021-01-14 Issue:4 Volume:9 Page:163-168
ISSN:2166-3831
Container-title:Materials Research Letters
language:en
Short-container-title:Materials Research Letters

Author:

Pinho Pâmella Vasconcelos Borges¹²^ORCID,Chartier Alain¹,Miserque Frédéric¹,Menut Denis³,Moussy Jean-Baptiste²

Affiliation:

1. DEN – Service de la Corrosion et du Comportement des Matériaux dans leur Environnement (SCCME), CEA, Université Paris-Saclay, Gif-sur-Yvette, France

2. Université Paris-Saclay, CEA, CNRS, SPEC, Gif-sur-Yvette, France

3. Synchrotron SOLEIL, L’Orme des Merisiers, Gif-sur-Yvette, France

Publisher

Informa UK Limited

Subject

General Materials Science

Link

https://www.tandfonline.com/doi/pdf/10.1080/21663831.2020.1863877

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