Electrical Characterization of Thin Cr/Indium-Tin Oxide Layer by RF Sputtering-Reference-Cited by-同舟云学术

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Electrical Characterization of Thin Cr/Indium-Tin Oxide Layer by RF Sputtering

Published:2015-06-09 Issue:11 Volume:45 Page:1728-1732
ISSN:1553-3174
Container-title:Synthesis and Reactivity in Inorganic, Metal-Organic, and Nano-Metal Chemistry
language:en
Short-container-title:Synthesis and Reactivity in Inorganic, Metal-Organic, and Nano-Metal Chemistry

Author:

Akbarnejad Elaheh¹²,Soleimani Ebrahim A.²,Ghorannevis Zohreh³

Affiliation:

1. Plasma Physics Research Centre, Science and Research Branch, Islamic Azad University, Tehran, I. R. Iran

2. Thin Film Laboratory, ECE Department, University of Tehran, Tehran, I. R. Iran

3. Department of Physics, Islamic Azad University, Karaj Branch, Karaj, I. R. Iran

Publisher

Informa UK Limited

Subject

Inorganic Chemistry,Physical and Theoretical Chemistry

Link

https://www.tandfonline.com/doi/pdf/10.1080/15533174.2013.871732

Reference17 articles.

1. Britt, J.; Wiedemann, S.; Wendt, R.; Albright, S. Technical Report NRELySR-520-26840, 1999.

2. Flexible and monolithically integrated CIGS-Modules

3. Dielectric barriers for flexible CIGS solar modules

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