Potical Energy Gap and Below Gap Optical Absorption of Fullerene Films Measured By Constant Photocurrent Method and Photothermal Deflection Spectroscopy-Reference-Cited by-同舟云学术

Potical Energy Gap and Below Gap Optical Absorption of Fullerene Films Measured By Constant Photocurrent Method and Photothermal Deflection Spectroscopy

Published:1995-01 Issue:2 Volume:3 Page:163-178
ISSN:1064-122X
Container-title:Fullerene Science and Technology
language:en
Short-container-title:Fullerene Science and Technology

Author:

Hasegawa Shunichi,Nishiwaki Takahiro,Habuchi Hitoe,Nitta Shoji,Nonomura Shuichi

Publisher

Informa UK Limited

Subject

General Chemical Engineering

Link

http://www.tandfonline.com/doi/pdf/10.1080/153638X9508543778

Reference13 articles.

1. Spectral distribution of photoionization cross sections by photoconductivity measurements

2. Direct measurement of the gap states and band tail absorption by constant photocurrent method in amorphous silicon

3. Photothermal deflection spectroscopy at 77 K

4. ). Habuchi H. Nitta S. Nishiwaki T. Itoh T. Hasegawa S. Nonomura S.Advances in Superconductivity-4, Vol. 2 , Eds. Fujita T. Shiohara Y. ( Springer-Verlag , 1994 ) 973 .

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