A polarized reflectance model for remote sensing of densely vegetated surfaces-Reference-Cited by-同舟云学术

A polarized reflectance model for remote sensing of densely vegetated surfaces

Published:2018-10-25 Issue:3 Volume:65 Page:445-454
ISSN:1449-8596
Container-title:Journal of Spatial Science
language:en
Short-container-title:Journal of Spatial Science

Author:

Zhao Haimeng¹,Yang Bin²,Wang Qiang³^ORCID,Wu Yi⁴,Sun Shanlin¹

Affiliation:

1. Guangxi Colleges and Universities Key Laboratory of Unmanned Aerial Vehicle (UAV) Remote Sensing, Guilin University of Aerospace Technology, Guilin, China

2. School of Electric and Information Engineering, Hunan University, Changsha, China

3. School of Geographic and Environment Science, Tianjin Normal University, Tianjin, China

4. Guangxi Zhuang Autonomous Region Environmental Monitoring Centre, Nanning, China

Funder

National Natural Science Foundation of China

The Key Research and Development Program of Guangxi

Publisher

Informa UK Limited

Subject

Atmospheric Science,General Energy,Geography, Planning and Development

Link

https://www.tandfonline.com/doi/pdf/10.1080/14498596.2018.1515675

Reference22 articles.

1. Polarized reflectance of bare soils and vegetation: measurements and models

2. Exploration of a Polarized Surface Bidirectional Reflectance Model Using the Ground-Based Multiangle SpectroPolarimetric Imager

3. Polarized and specular reflectance variation with leaf surface features

4. Atmospherically resistant vegetation index (ARVI) for EOS-MODIS

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. SAR Time-Series for Soybean Pod Formation Detection;IGARSS 2024 - 2024 IEEE International Geoscience and Remote Sensing Symposium;2024-07-07

2. Semi-empirical SAR vegetation index for crop discrimination based on biomass in semi-arid region: A case study in Perambalur district, India;Remote Sensing Applications: Society and Environment;2023-11

3. Change detection in Fangcheng Golden Camellia National Nature Reserve based on PCA and K-means clustering;Second International Conference on Electronic Information Technology (EIT 2023);2023-08-15