Recent Progress on <i>In-situ</i> and <i>Operando</i> Analysis using Soft X-ray Spectroscopy-Reference-Cited by-同舟云学术

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Recent Progress on In-situ and Operando Analysis using Soft X-ray Spectroscopy

Published:2016 Issue:12 Volume:59 Page:333-340
ISSN:1882-2398
Container-title:Journal of the Vacuum Society of Japan
language:en
Short-container-title:J. Vac. Soc. Jpn.

Author:

TAMENORI Yusuke¹

Affiliation:

1. Research & Utilization Division Japan Synchrotron Radiation Research Institute

Publisher

The Vacuum Society of Japan

Subject

Spectroscopy,Surfaces and Interfaces,Instrumentation,General Materials Science

Link

https://www.jstage.jst.go.jp/article/jvsj2/59/12/59_16-RV-042/_pdf

Reference58 articles.

1. 1) W. Gudat and C. Kunz: Phys. Rev. Lett., 29 (1972) 169.

2. 2) J. Stöhr: NEXAFS Spectroscopy (Springer, Berlin, 1992).

3. 3) B. X. Yang and J. Kirz: Phys. Rev. B, 36 (1987) 1361.

4. 4) M. D. Roper, G. van der Laan, J. V. Flaherty and H. A. Padmore: Rev. Sci. Instrum., 63 (1992) 1482.

5. 5) A. Kivimaki, K. Maier, U. Hergenhahn, M. N. Piancastelli, B. Kempgens, A. Rudel and A. M. Bradshaw: Phys. Rev. Lett., 81 (1998) 301.

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