[Invited Paper] A High SNR Global Shutter CMOS Image Sensor Technology for High Precision Absorption Imaging Applications-Reference-Cited by-同舟云学术

[Invited Paper] A High SNR Global Shutter CMOS Image Sensor Technology for High Precision Absorption Imaging Applications

Published:2024 Issue:2 Volume:12 Page:167-174
ISSN:2186-7364
Container-title:ITE Transactions on Media Technology and Applications
language:en
Short-container-title:MTA

Author:

Oikawa Tetsu¹,Kuroda Rihito¹²,Hamaya Aoi¹,Shiba Yoshinobu²³,Inada Takafumi²³,Sakai Yushi²³,Shirai Yasuyuki²,Sugawa Shigetoshi²

Affiliation:

1. Graduate School of Engineering, Tohoku University

2. New Industry Creation Hatchery Center, Tohoku University

3. Fujikin Inc.

Publisher

Institute of Image Information and Television Engineers

Link

https://www.jstage.jst.go.jp/article/mta/12/2/12_167/_pdf

Reference24 articles.

1. 1) T. Pakpuwadon, K. Sasagawa, M. Chiristian Guinto, Y. Ohta, M. Haruta, H. Takehara, H. Tashiro and J. Ohta: "Self-Reset Image Sensor With a Signal-to-Noise Ratio Over 70 dB and Its Application to Brain Surface Imaging", Front Neurosci, Vol. 15 (Jun 2021)

2. 2) C. Cao, M. Hakamata, K. Yasutomi, K. Kagawa, S. Aoyama, N. Tsumura and S. Kawahito: "Signal-to-Noise Ratio Enhancement in Cardiac Pulse Measurements Using Multitap CMOS Image Sensors With In-Pixel Temporal Redundant Samplings", IEEE Trans. Electron Devices, 69, 6, pp.2851-2857 (June 2022)

3. 3) K. Nakata, R. Orihara, Y. Mizuoka and K. Takagi: "A Comprehensive Big-Data-Based Monitoring System for Yield Enhancement in Semiconductor Manufacturing", IEEE Trans. Electron Devices, 30, 4, pp.339-344 (Nov 2017)

4. 4) R. Kuroda, T. Akutsu, Y. Koda, K. Takubo, H. Tominaga, R. Hirose, T. Karasawa and S. Sugawa: "A High Quantum Efficiency High Readout Speed 1024 Pixel Ultraviolet-Visible-Near Infrared Waveband Photodiode Array", ITE Trans. Media Technology and Applications, 4, 2, pp.109-115 (April 2016)

5. 5) S. Sugawa, N. Akahane, S. Adachi, K. Mori, T. Ishiuchi and K. Mizobuchi, "A 100 dB dynamic range CMOS image sensor using a lateral overflow integration capacitor", In Digest of Technical Papers of the IEEE International Solid-State Circuits Conference (ISSCC), pp.352-353 (Feb 2005)