[Paper] A 2-Tap 4-Phase Indirect Time-of-Flight Ranging Method using Half-Pulse Modulation for Depth Precision Enhancement and Sub-Frame Operation for Motion Artifact Suppression-Reference-Cited by-同舟云学术

[Paper] A 2-Tap 4-Phase Indirect Time-of-Flight Ranging Method using Half-Pulse Modulation for Depth Precision Enhancement and Sub-Frame Operation for Motion Artifact Suppression

Published:2023 Issue:3 Volume:11 Page:123-129
ISSN:2186-7364
Container-title:ITE Transactions on Media Technology and Applications
language:en
Short-container-title:MTA

Author:

Kuo Chia-Chi¹,Kuroda Rihito¹

Affiliation:

1. Graduate School of Engineering, Tohoku University

Publisher

Institute of Image Information and Television Engineers

Subject

Computer Graphics and Computer-Aided Design,Media Technology,Signal Processing

Link

https://www.jstage.jst.go.jp/article/mta/11/3/11_123/_pdf

Reference22 articles.

1. 1) C. S. Bamji et al. : “IMpixel 65nm BSI 320MHz demodulated TOF Image sensor with 3μm global shutter pixels and analog binning”, in IEEE International Solid-State Circuits Conference-(ISSCC), pp. 94-96 (2018)

2. 2) Y. Ebiko et al. : “Low power consumption and high resolution 1280X960 Gate Assisted Photonic Demodulator pixel for indirect Time of flight”, in IEEE International Electron Devices Meeting (IEDM), pp. 31-33 (2020)

3. 3) M. S. Keel et al. : “A VGA Indirect Time-of-Flight CMOS Image Sensor with 4-Tap 7-μm Global-Shutter Pixel and Fixed-Pattern Phase Noise Self-Compensation”, IEEE J Solid-State Circuits, vol. 55, no. 4, pp. 889-897 (Apr. 2020)

4. 4) J. Kang et al. : “A 640×480 Indirect Time-of-Flight Image Sensor with Tetra Pixel Architecture for Tap Mismatch Calibration and Motion Artifact Suppression”, in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), pp. 44-45 (2020)

5. 5) M. S. Keel et al. : “A 1.2-Mpixel Indirect Time-of-Flight Image Sensor with 4-Tap 3.5-μm Pixels for Peak Current Mitigation and Multi-User Interference Cancellation”, IEEE J Solid-State Circuits, vol. 56, no. 11, pp. 3209-3219 (Nov. 2021)