CRITICAL MODEL COMPONENTS AND THEIR FINGERPRINT FEATURES IN THE SIMULATED CONDUCTED RADIO FREQUENCY IMMUNITY OF COMPLEX INTEGRATED CIRCUITS
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Published:2013
Issue:
Volume:139
Page:689-720
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ISSN:1559-8985
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Container-title:Progress In Electromagnetics Research
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language:en
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Short-container-title:PIER
Author:
Su Tao,Yang Yehua,Wang Zixin
Publisher
The Electromagnetics Academy
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Radiation