ESTIMATION OF THE AGEING OF METALLIC LAYERS IN POWER SEMICONDUCTOR MODULES USING THE EDDY CURRENT METHOD AND ARTIFICIAL NEURAL NETWORKS
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Published:2014
Issue:
Volume:40
Page:129-141
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ISSN:1937-8726
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Container-title:Progress In Electromagnetics Research M
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language:en
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Short-container-title:PIER M
Author:
Nguyen Tien Anh,Joubert Pierre-Yves,Lefebvre Stephane
Publisher
The Electromagnetics Academy
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials