Subject
Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials
Cited by
4 articles.
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1. GaAs yarıiletken yüzeyinde mikro yarıkların üretilmesi ve FLIM tekniği ile yüzey karakterizasyonu;Ömer Halisdemir Üniversitesi Mühendislik Bilimleri Dergisi;2022-05-09
2. MOS technology development on 150 mm Ge wafers;2021 IEEE 48th Photovoltaic Specialists Conference (PVSC);2021-06-20
3. Quantitative analysis of time-resolved microwave conductivity data;Journal of Physics D: Applied Physics;2017-11-10
4. Erratum: “Resonant coupling for contactless measurement of carrier lifetime” [J. Vac. Sci. Technol. B 31, 04D113 (2013)];Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2013-09